A Chip for Fault Detection Experiments


We present the design and implementation of a chip to serve as a vehicle for test experiments. The chip implements a one-channel 8-bit DMA controller, and includes some special circuitry to act as faults. Each fault can be turned on or off by programming a set of pins and the experiment consists of finding a test set that can recognize a fault when it is turned on.


Stephen D. Brown and Zvonko Vranesic, "A Chip for Fault Detection Experiments," Journal of Semi-Custom ICs, Vol. 7, No. 5, 1990, pp. 48-50.

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