A Chip for Fault Detection Experiments
We present the design and implementation of a chip to serve as a
vehicle for test experiments. The chip implements a one-channel 8-bit
DMA controller, and includes some special circuitry to act as faults.
Each fault can be turned on or off by programming a set of pins and
the experiment consists of finding a test set that can recognize a
fault when it is turned on.
Stephen D. Brown and Zvonko Vranesic, "A Chip for Fault Detection Experiments," Journal of Semi-Custom ICs, Vol. 7, No. 5, 1990, pp. 48-50.
(Download Full Paper)